Ion-tof公司

WebUniversity of Texas at Austin Web29 mrt. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering … The M6 Plus - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... SurfaceLab 7 - IONTOF - TOF-SIMS (time of flight secondary ion mass … The basic instrument is equipped with a reflectron TOF analyser giving high … Low Energy Ion Scattering - IONTOF - TOF-SIMS (time of flight secondary ion … With the Q Exactive TM extension for the M6, IONTOF provides the first … Service - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Sales - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Applications - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ...

TOFSIMS, IONTOF, 北京艾飞拓, 飞行时间二次离子质谱

Web22 dec. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis WebTime-of-Flight Secondary Ion Mass Spectrometry Summary Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular ions with mass-to-charge ratios ranging from m/z 1 to m/z 10,000 in a single spectrum. how to take a screenshot on xbox series x https://davemaller.com

ToF 3D传感方案争奇斗艳，系统厂商如何选？ - 知乎

Web26 dec. 2009 · 本文简要叙述法国cameca 公司,德国ion tof gmbh 公司新型的nano sims50ims wf ims sc uitra tof sims iv 型二次离子质谱的特色,着重介绍这些仪器改进过的和新增加的 … WebTime-of-Flight Secondary Ion Mass Spectrometry, or TOF-SIMS, works by rastering a pulsed beam of focused primary ions across the area of interest, resulting in the emission of secondary ions which are characteristic of the materials present in the top several monolayers of the sample.By accurately measuring the masses of the detected ions they … http://www.iontof.com.cn/ ready for spring quotes

【案例集锦】维感科技3D ToF相机在户外场景中的应用介绍

Category:IONTOF - TOF-SIMS (time of flight secondary ion mass …

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Ion-tof公司

Evaluation of matrix effects on TOF-SIMS data of leu-enkephalin …

Web为了进一步简化谱图数据处理，IONTOF 为 M6 提供了各种工具，例如质谱图库，完全集成的多元统计分析（MVSA）软件包，以及强大性能的 Q ExactiveTM 功能扩展。 M6 TOF … http://www.iontof.com.cn/bk_16938892.html

Ion-tof公司

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Web我司作为德国ion-tof公司的中国总代理，成立于2012年。主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。公司成员来自北京大学、中科院物理所等一流院校 … Web24 mrt. 2024 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. Commonly, the …

WebThe TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF Company. Its design guarantees optimum performance in all fields of SIMS applications. The instruments offers three ion sources offering Bi1–7+, Cs+ and O2+ and is equipped with a reflectron TOF analyzer giving high secondary ion transmission with ... Web• TOF-SIMS: “ION-TOF IV” instrument. Ga-LMIS analytical source, 25 keV, high current bunched mode (typically m/∆m = 8000), analysis area 60×60 µm2. Sputter source Ar-EI, 3 keV, sputter area 200×200 µm2. Pulsed electron source for neutralisa-tion, 4×10–6 mbar argon flooding for sensitivity enhancement.

WebIONTOF GmbH Heisenbergstr.15 48149 Münster Germany www.iontof.com Registergericht: Amtsgericht Münster, HRB 10680 Geschäftsführer: Dr. Ewald Niehuis Website … WebThe ioniTOF mass analyzer is designed as a modular and flexible TOF-MS platform that allows you to choose the mass resolving power you need and also upgrade to higher resolution if you feel the need at a later stage of your experiments. The ioniTOF is available with mass resolutions ranging from 500 to even more than 10,000.

WebIONTOFジャパン株式会社 Your NEW Partner for Surface Analysis 2024年4月始動！ M6 - SIMS technology one step ahead M6 は、IONTOF社が提案する最新世代の TOF-SIMS です。 最新のイオン銃およびアナライザーを搭載し、分析性能、操作性が大きく向上しました。 あらゆる分野の分析ニーズに対応し、産業および学術研究に理想的な製品です。 …

WebAn ion source (either pulsed or continuous) is used for lab-related TOF experiments, but not needed for TOF analyzers used in space, where the sun or planetary ionospheres … ready for some gym time maybeWebUltra-high transmission for optimized molecular sensitivity and monolayer analysis High speed (> 8 kHz) TOF-SIMS (MS 1) and tandem MS (MS 2) imaging High resolution (< 100 nm) TOF-SIMS (MS 1) and tandem MS … ready for something crosswordWeb25 mei 2024 · IONTOF GmbH 626 followers on LinkedIn. Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments ... how to take a screenshot on zephyrus g14WebION-TOF公司创建于1989年，是专门研究和生产飞行时间二次离子质谱仪器(TOF-SIMS)的高科技公司。 其创始人贝宁豪文(Beninghoven)教授是静态二次离子质谱的奠基人，创建 … ready for sunday 2http://www.iontof.com.cn/vip_doc/7653215.html how to take a screenshot on yoga 910WebThe positive and negative spectra for each sample were acquired using TOF-SIMS.5 (ION-TOF GmbH, Münster) with 60 keV Bi 3 2+, current of 0.2 pA, as a primary ion beam and a 10 keV Ar 1000 +, current of 2 nA, as a sputtering beam. 16 The analysis area was 100 × 100 μm 2, with a pixel density of 128 × 128, and the sputtering area was 500 × ... ready for take off nickstory 2015WebZ-Gap MCP Microchannel Plate Detectors are available with 18mm, 25mm or 40mm Microchannel Plates. Note: Z-Gap detectors cannot be used to detect negative ions or electrons. Jordan TOF Products, Inc. 990 Golden Gate Terrace Grass Valley, CA 95945 Phone: 530-272-4580 E-mail: [email protected] ready for spring gif